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More complete semantics (including behavioral constraints and collaboration patterns) for components are needed to ensure consistent interactions among components developed by separate suppliers
12-89 (technical revision)
• Ion-exchange resins
Wafer near-edge geometry can significantly affect the yield of semiconductor device processing
The number of bins varies by vendor and model
T00300 - SEMI T3 - Specification for Wafer Box Labels Revision:SEMI T3-1213 (Reapproved 0419) - Superseded More complete semantics (including behavioralThis Specification provides a common format, content, size, and location for printed, machine readable labels on wafer boxes to facilitate communication of data essential for advanced traceability and electronic data exchange systems. These labels differ from those used in common commercial practice in that they provide less detailed information about parametric properties of the wafer. Such information is now readily stored in advanced traceability
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