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Support for optional attributes
This procedure applies only to large scale bulk purifiers rated at greater than 50 liters-per-minute (LPM) flow rate
No test is provided for the blend radius at the apex of the notch
wall) tubing and components
It defines the view of the equipment through the SECS communication link
HB00600 - SEMI HB6 - Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers by Using Optical Probes StdPbc-0817 Support for optional attributesThis Standard was technically approved by the HB LED Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 4, 2015. Available at www. semiviews. org and www. semi. org in March 2016; originally published June 2015. Crystalline sapphire wafers (CSW) are used as substrates for manufacturing compound semiconductor devices, in particular high brightness light emitting diodes (HB
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